Höchstauflösende Inspektion
Einfache, schnelle und zerstörungsfreie
2D & 3D Messungen
Intelligente XYZ Stative
Vergrößerung 0.1x – 10.000x
Hochauflösende Profilometrie
Z-Auflösung unter 1μm
Ultra schnelle Profilerstellung
ISO 25178-062 Messungen (Sa, Ra...)
Automatisierung & Berichtserstellung
Anspruchsvolle Performance
Benuzterfreundliche Bedienung
Hochauflösende & Hochvergrößernde REM Aufnahmen
Automatischer Fokus, - Beleuchung & - Kontrast
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